ATE_DPT.1 Testing: high-level design
Objectives
The subsystems of a TSF provide a high-level description of the internal workings of the TSF. Testing at the level of the subsystems, in order to demonstrate the presence of any flaws, provides assurance that the TSF subsystems have been correctly realised.
Application notes
The developer is expected to describe the testing of the high-level design of the TSF in terms of "subsystems". The term "subsystem" is used to express the notion of decomposing the TSF into a relatively small number of parts.
Dependencies:
ADV_HLD.1 Descriptive high-level design
ATE_FUN.1 Functional testing
Developer action elements:
ATE_DPT.1.1D The developer shall provide the analysis of the depth of testing.
Content and presentation of evidence elements:
ATE_DPT.1.1C The depth analysis shall demonstrate that the tests identified in the test documentation are sufficient to demonstrate that the TSF operates in accordance with its high-level design.
Evaluator action elements:
ATE_DPT.1.1E The evaluator shall confirm that the information provided meets all requirements for content and presentation of evidence.